Bottom-up methodology for test preparation and refinementJ.A. Gracio, P.A. Bicudo, N.N. Rua, Arlindo L. Oliveira, C.F.B. Almeida, J.P. Teixeira conference summary
Bottom-up testing methodology for VLSIJ.P. Teixeira, C.F.B. Almeida, J.A. Gracio, P.A. Bicudo, Arlindo L. Oliveira, N.N. Rua conference summary
Test preparation and fault analysis using a bottom-up methodologyJ.A. Gracio, P.A. Bicudo, N.N. Rua, Arlindo L. Oliveira, C.F.B. Almeida, J.P. Teixeira conference summary
Implicit Resolution of the Chapman-Kolmogorov Equations for Sequential Circuits: An Application in Power EstimationAna T. Freitas, Arlindo L. Oliveira2003 Design, Automation and Test in Europe Conference and Exhibition conference summary
Analog Macromodeling using Kernel MethodsJoel Phillips, João L. Afonso, Arlindo L. Oliveira, L. Miguel SilveiraICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486) conference summary